Semiconductors also have traditionally gone through similar stages. In their early stages, they are often prone to design or manufacturing errors. Once these have been resolved, reliability and performance are stabilized in the middle years. However, excessive use eventually leads to a “wear out” phase and failure.

In a recent EE Times column, a team of SK hynix experts led by Sangdeok Kim, vice president and head of advanced quality and analysis at SK hynix, provides insights on how engineers are working to extend the lifespan of semiconductors. Much like health experts dedicated to improving the lives of people, SK hynix experts and development engineers are pioneering new ways to identify and fix potentially fatal errors earlier in the life of a semiconductor.

New techniques, such as In-DRAM ECC, are able to correct 1-bit errors in a single DRAM cell. This is a major leap forward considering a 16 Gb DRAM has 16 billion cells in one chip and an error in just one cell could cause the entire chip to fail. The ultimate goal is to continue pushing the boundaries on the useful life of each semiconductor, an important effort as devices and data become even more important to our daily lives.

For more on this topic, please read the full column at this link – EE Times: The Lifetime of a Human and Semiconductor.

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